At NY CREATES, providing opportunities for hands-on training with advanced semiconductor research tools is a significant aspect of workforce development and student education. One such tool that is now being used for research and analysis is the Bruker D8 DISCOVER Plus, an X-ray Diffractometer (XRD) used for materials characterization in both academic and industry settings.
Innovative Technology Applications
X-ray diffraction is a technique that enables the precise analysis of the structure and composition of a wide variety of materials by investigating their crystalline structure and measuring how X-rays interact with the material’s atoms.
This process allows users to identify compounds by analyzing their atomic arrangement, providing a unique “fingerprint” of the material. Thin films and layered structures can also be investigated to determine thickness, interface roughness, and density, and measurement of the internal stress of stacked layers helps ensure high-performance material properties in semiconductor applications. Analysis of a material’s crystalline quality also supports the optimization of material performance in next-generation electronics
Bridging Education and Industry
Access to the X-ray diffractometer can be valuable for students and researchers preparing for careers in semiconductor-related fields, especially because the configuration of the instrument at the NY CREATES lab offers great experimental flexibility and fast, very reliable results. This particular instrument also has an Atlas goniometer, and a non-coplanar arm, both with very stringent specifications in terms of resolution, accuracy and repeatability, that make it one of the most advanced in the industry.
NY CREATES provides training for students and individual researchers to operate the Bruker D8 DISCOVER Plus independently, helping them develop practical skills in materials characterization and data analysis. This experience not only strengthens their technical expertise but also enhances their career readiness, making them competitive candidates for industry roles upon graduation.
Beyond student training, this cutting-edge tool also serves as a resource for on-site partners, who are able to utilize it for high-precision data analysis of several different materials. In this way, its availability at NY CREATES’ Albany NanoTech Complex contributes to collaboration between academic institutions and industry partners.
Shaping the Future of Semiconductor Talent
As semiconductor technology continues to evolve, exposure and accessibility to innovative R&D tools remain important components of workforce development. This diffractometer is just one of several resources available at NY CREATES’ Albany NanoTech Complex that support technical training, research, and collaboration with industry and academic partners.
Providing valuable training with these tools empowers students and researchers to develop real-world technical expertise in materials science and semiconductor engineering and serves to strengthen connections between amongst members of the site’s unique chips-focused ecosystem.